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Microelectronics

Tests

  • Development of test processes and programs as well as test jigs according to the customer specifi cations
  • Electrical tests: Complex automatic RF and microwave function tests at measuring stations up to 50 GHz
  • Automatic active and passive laser trimming
  • X-Ray inspection for material analysis, non-destructive testing of layer thicknesses
  • X-Ray analysis for monitoring of components processing like BGA, flip chip assembly
  • Pull and shear tests
  • Gross and fine leak test
  • Laser profi le measurement (e. g. adhesive thickness)
  • Burn in test, PIND test
  • Environmental tests: Temperature/humidity storage, thermal cycle and shock, vibration, acceleration, mechanical shock test