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Microelectronics

Screening/Test

Realization according to standard specification

  • MIL-STD-883
  • MIL-PRF-38534
  • ESA PSS-01-608 / ECSS Q-60-05
  • KTA 1401
  • customer specifications

Test facilities

  • burn-in
  • temperatures storage / humidity
  • temperature cycling / thermal shock
  • vibration
  • acceleration
  • testing of the generic parameters
    U, I, R, C, f, t
  • HF-measurement technique up to 50 GHz

Qualification of components and assemblies according to MIL and ESA standards